A HIGH-RESOLUTION, LOW-ENERGY ELECTRON DIFFRACTOMETER BASED ON A FIELD-EMISSION SOURCE

被引：12

作者：

MARTIN, JA ^{[1
]}

LAGALLY, MG ^{[1
]}

机构：

[1] UNIV WISCONSIN,CTR MAT SCI,MADISON,WI 53706

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1983年 / 1卷 / 02期

关键词：

D O I：

10.1116/1.571902

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1210 / 1211

页数：2

相关论文

共 7 条

[1] LEED STUDIES OF SURFACE IMPERFECTIONS
HENZLER, M
[J]. APPLICATIONS OF SURFACE SCIENCE, 1982, 11-2 (JUL): : 450 - 469
[2] LAGALLY MG, 1982, SPRINGER SERIES CHEM, V20
[3] THE RESOLVING POWER OF A LOW-ENERGY ELECTRON DIFFRACTOMETER AND THE ANALYSIS OF SURFACE-DEFECTS
LU, TM
LAGALLY, MG
[J]. SURFACE SCIENCE, 1980, 99 (03) : 695 - 713
[4] MARTIN J, UNPUB
[5] MARTIN JA, UNPUB REV SCI INSTRU
[6] SAVAGE DE, UNPUB
[7] 1889, Patent No. 404398