ANALYSIS OF REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION DATA FROM RECONSTRUCTED SEMICONDUCTOR SURFACES

被引：142

作者：

JOYCE, BA

NEAVE, JH

DOBSON, PJ

LARSEN, PK

机构：

[1] UNIV LONDON IMPERIAL COLL SCI & TECHNOL,DEPT PHYS,LONDON SW7 2AZ,ENGLAND

[2] PHILIPS RES LABS,5600 MD EINDHOVEN,NETHERLANDS

来源：

PHYSICAL REVIEW B | 1984年 / 29卷 / 02期

关键词：

D O I：

10.1103/PhysRevB.29.814

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：814 / 819

页数：6

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