AN EVALUATION OF THE SUITABILITY OF THERMAL WAVE INTERFEROMETRY FOR THE TESTING OF PLASMA SPRAYED COATINGS

被引:26
作者
ALMOND, DP
PATEL, PM
PICKUP, IM
REITER, H
机构
[1] Univ of Bath, Sch of Materials, Science, Bath, Engl, Univ of Bath, Sch of Materials Science, Bath, Engl
来源
NDT INTERNATIONAL | 1985年 / 18卷 / 01期
关键词
FILMS - Thickness Measurement - INFRARED RADIATION - INTERFEROMETRY;
D O I
10.1016/0308-9126(85)90038-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thermal wave interferometry is explained and a photothermal testing system using the technique described. Results presented show that the technique monitored the thickness of a plasma sprayed coating and detected an adhesion defect successfully. The effect of coated component size on the measurements and factors which influence the applicability of the new testing technique are discussed.
引用
收藏
页码:17 / 24
页数:8
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