CHARACTERIZATION OF MULTILAYERS FOR EXTENDED ULTRAVIOLET OPTICS

被引：6

作者：

FERNANDEZ, FE

FALCO, CM

DHEZ, P

KHANDARSHAHABAD, A

NEVOT, L

PARDO, B

CORNO, J

VIDAL, B

机构：

[1] UNIV PARIS 11,LURE,F-91405 ORSAY,FRANCE

[2] UNIV PARIS 11,INST OPT,F-61406 ORSAY,FRANCE

[3] UNIV AIX MARSEILLE 3,FAC SCI ST JEROME,F-13397 MARSEILLE,FRANCE

来源：

APPLIED PHYSICS LETTERS | 1987年 / 51卷 / 12期

关键词：

D O I：

10.1063/1.98842

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：880 / 882

页数：3

共 11 条

[1]

CHAVINEAU JP, 1985, P SPIE, V563, P245

[2]

Edwards D. F., 1985, HDB OPTICAL CONSTANT, P547

[3]

FALCO CM, 1986, IN PRESS P SPIE, V733

[4]

Fernandez F. E., 1985, Proceedings of the SPIE - The International Society for Optical Engineering, V563, P195, DOI 10.1117/12.949668

[5]

HUNTER WR, 1985, HDB OPTICAL CONSTANT, P69

[6]

James R. W., 1948, OPTICAL PRINCIPLES D

[7]

KHANDAR A, 1986, P SOC PHOTO-OPT INS, V688, P176

[8]

Klug H.P., 1974, XRAY DIFFRACTION PRO, V2nd

[9] CHARACTERIZATION OF LAYERED SYNTHETIC MICROSTRUCTURE BY TRANSMISSION ELECTRON-MICROSCOPY AND DIFFRACTION [J].

LEPETRE, Y ;

RASIGNI, G .

OPTICS LETTERS, 1984, 9 (10) :433-434

[10]

Lynch D W, 1985, HDB OPTICAL CONSTANT, P357

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