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MEASUREMENT OF LATTICE PARAMETER OF SILICON USING A DOUBLE-DIFFRACTION EFFECT

被引：20
作者：
ISHERWOOD, BJ
WALLACE, CA
机构：
来源：
NATURE | 1966年 / 212卷 / 5058期
关键词：
D O I：
10.1038/212173a0
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
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页码：173 / +
页数：1
相关论文
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