COMPUTER EXPERIMENTS FOR TILTED BEAM DARK-FIELD IMAGING

被引：18

作者：

KRAKOW, W ^{[1
]}

机构：

[1] XEROX CORP,ROCHESTER,NY 14644

来源：

ULTRAMICROSCOPY | 1976年 / 1卷 / 03期

关键词：

Compendex;

D O I：

10.1016/0304-3991(76)90035-8

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

IMAGING TECHNIQUES

引用

页码：203 / 221

页数：19

共 30 条

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