IMAGE-RECONSTRUCTION USING ELECTRON MICRODIFFRACTION PATTERNS FROM OVERLAPPING REGIONS

被引：15

作者：

KONNERT, J

DANTONIO, P

机构：

来源：

ULTRAMICROSCOPY | 1986年 / 19卷 / 03期

关键词：

D O I：

10.1016/0304-3991(86)90214-7

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

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页码：267 / 277

页数：11

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[2] EXTENSION OF SCANNING-TRANSMISSION ELECTRON-MICROSCOPY BY USE OF DIFFRACTION INFORMATION
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[3] COMPARISON OF RADIAL-DISTRIBUTION FUNCTION FOR SILICA GLASS WITH THOSE FOR VARIOUS BONDING TOPOLOGIES - USE OF CORRELATION-FUNCTION
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[4] A Fourier series method for the determination of the components of interatomic distances in crystals
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