TRACK DAMAGE AND EROSION OF INSULATORS BY ION-INDUCED ELECTRONIC PROCESSES

被引:62
作者
TOMBRELLO, TA
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关键词
D O I
10.1016/0168-583X(84)90265-9
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:555 / 563
页数:9
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