INPLANE DISPLACEMENT MEASUREMENT CONFIGURATION WITH TWOFOLD SENSITIVITY

被引：18

作者：

SIROHI, RS

MOHAN, NK

机构：

[1] Applied Optics Laboratory, Department of Physics, Indian Institute of Technology, Madras

来源：

APPLIED OPTICS | 1993年 / 32卷 / 31期

关键词：

D O I：

10.1364/AO.32.006387

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

An optical configuration is suggested that will achieve a twofold increase in sensitivity when one measures an in-plane displacement component of a deformation vector compared with the Leendertz two-beam illumination method. A theory and experimental demonstration of the method are presented.

引用

页码：6387 / 6390

页数：4

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