SURFACE-COMPOSITION AND ELECTRONIC-STRUCTURE OF ZEOLITES USING X-RAY PHOTOELECTRON-SPECTROSCOPY

被引：19

作者：

KAUSHIK, VK ^{[1
]}

BHAT, SGT ^{[1
]}

CORBIN, DR ^{[1
]}

机构：

[1] DUPONT CO INC,CENT RES & DEV,WILMINGTON,DE

来源：

ZEOLITES | 1993年 / 13卷 / 08期

关键词：

X-RAY PHOTOELECTRON SPECTROSCOPY; SURFACE COMPOSITION; ELECTRONIC STRUCTURE; ZEOLITES;

D O I：

10.1016/0144-2449(93)90141-O

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Synthetic and mineral zeolites with well-characterized bulk and framework composition over a wide range of Si/Al atomic ratios have been characterized by ESCA for the determination of Si/Al composition of external layers. These surface Si/Al values have been compared to the bulk and framework stoichiometric values determined by various techniques. As the change in Si/Al ratio affects the crystalline structure of zeolites, such change is reflected in the binding energy shift of framework atoms.

引用

页码：671 / 677

页数：7

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