PRELIMINARY STUDIES IN THE DETERMINATION OF THE ALKALI-METALS BY MICROWAVE INDUCED PLASMA (MIP) SPECTROMETRY

被引：19

作者：

HAAS, DL

JAMERSON, JD

机构：

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1987年 / 42卷 / 1-2期

关键词：

D O I：

10.1016/0584-8547(87)80071-X

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：299 / 307

页数：9

共 19 条

[1]

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[2]

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[3] CAVITY FOR MICROWAVE-INDUCED PLASMAS OPERATED IN HELIUM AND ARGON AT ATMOSPHERIC-PRESSURE [J].

BEENAKKER, CIM .

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1976, 31 (8-9) :483-486

[4] EVALUATION OF A MICROWAVE-INDUCED PLASMA IN HELIUM AT ATMOSPHERIC-PRESSURE AS AN ELEMENT-SELECTIVE DETECTOR FOR GAS-CHROMATOGRAPHY [J].

BEENAKKER, CIM .

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1977, 32 (3-4) :173-187

[5]

CARNAHAN JW, 1983, AM LAB, V15, P31

[6]

CARNAHAN JW, 1981, ANAL CHIM ACTA, V130, P247

[7] AXIAL VIEW OF AN INDUCTIVELY COUPLED PLASMA [J].

DAVIES, J ;

DEAN, JR ;

SNOOK, RD .

ANALYST, 1985, 110 (05) :535-540

[8] EVALUATION OF THE AXIALLY VIEWED (END-ON) INDUCTIVELY COUPLED ARGON PLASMA SOURCE FOR ATOMIC EMISSION-SPECTROSCOPY [J].

DEMERS, DR .

APPLIED SPECTROSCOPY, 1979, 33 (06) :584-591

[9]

ESTES SA, 1981, ANAL CHEM, V53, P1829, DOI 10.1021/ac00235a026

[10] TOP-DOWN VERSUS SIDE-ON VIEWING OF THE INDUCTIVELY COUPLED PLASMA [J].

FAIRES, LM ;

BIENIEWSKI, TM ;

APEL, CT ;

NIEMCZYK, TM .

APPLIED SPECTROSCOPY, 1985, 39 (01) :5-9

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