WAVEFORM EFFECTS IN WAVELENGTH MODULATION SPECTROMETRY

被引：33

作者：

OHAVER, TC ^{[1
]}

EPSTEIN, MS ^{[1
]}

ZANDER, AT ^{[1
]}

机构：

[1] UNIV MARYLAND,DEPT CHEM,COLLEGE PK,MD 20740

来源：

ANALYTICAL CHEMISTRY | 1977年 / 49卷 / 03期

关键词：

D O I：

10.1021/ac50011a032

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：458 / 461

页数：4

共 14 条

[1] DOUBLE MODULATION - OPTICAL SCANNING AND MECHANICAL CHOPPING - IN ATOMIC-ABSORPTION SPECTROMETRY USING A CONTINUUM SOURCE [J].

ELSER, RC ;

WINEFORDNER, JD .

ANALYTICAL CHEMISTRY, 1972, 44 (04) :698-+

[2] WAVELENGTH MODULATION FOR BACKGROUND CORRECTION IN GRAPHITE FURNACE ATOMIC EMISSION SPECTROMETRY [J].

EPSTEIN, MS ;

RAINS, TC ;

OHAVER, TC .

APPLIED SPECTROSCOPY, 1976, 30 (03) :324-329

[3] DOUBLE MODULATION ATOMIC FLUORESCENCE FLAME SPECTROMETRY [J].

FOWLER, WK ;

KNAPP, DO ;

WINEFORD.JD .

ANALYTICAL CHEMISTRY, 1974, 46 (04) :601-602

[4] THEORY OF DERIVATIVE SPECTROMETER [J].

HAGER, RN ;

ANDERSON, RC .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1970, 60 (11) :1444-&

[5]

KOIRTYOHANN SR, 1976, 3RD ANN FACSS BIC M

[6] EMISSION SPECTROMETRIC DETERMINATION OF TRACE AMOUNTS OF MERCURY [J].

LICHTE, FE ;

SKOGERBOE, RK .

ANALYTICAL CHEMISTRY, 1972, 44 (07) :1321-+

[7]

LICHTE FE, 1973, ANAL CHEM, V45, P399

[8] LOCK-IN AMPLIFIERS .1. [J].

OHAVER, TC .

JOURNAL OF CHEMICAL EDUCATION, 1972, 49 (03) :A131-&

[9]

OHAVER TC, 1973, 165TH NAT M AM CHEM

[10] DYNAMIC BACKGROUND CORRECTION SYSTEM FOR DIRECT READING SPECTROMETRY [J].

SKOGERBOE, RK ;

LAMOTHE, PJ ;

BASTIAANS, GJ ;

FREELAND, SJ ;

COLEMAN, GN .

APPLIED SPECTROSCOPY, 1976, 30 (05) :495-500

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