PERMITTIVITY MEASUREMENTS USING A FREQUENCY-TUNED MICROWAVE TE01 CAVITY RESONATOR

被引：15

作者：

NI, E

STUMPER, U

机构：

[1] Univ of Zheijang, Dep of Material,, Zheijang, China, Univ of Zheijang, Dep of Material, Zheijang, China

来源：

关键词：

D O I：

10.1049/ip-h-2.1985.0005

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：27 / 32

页数：6

共 10 条

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