SYSTEMATIC INQUIRY IN TESTS OF NEGATIVE POSITIVE REPLICA COMBINATIONS FOR SEM

被引：36

作者：

BROMAGE, TG ^{[1
]}

机构：

[1] UNIV TORONTO, DEPT ANTHROPOL, TORONTO M5S 1A1, ONTARIO, CANADA

来源：

JOURNAL OF MICROSCOPY | 1985年 / 137卷 / FEB期

关键词：

D O I：

10.1111/j.1365-2818.1985.tb02578.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

收藏

页码：209 / 216

页数：8

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