CRYSTALLOGRAPHIC ANALYSIS OF DOMAIN FORMATION IN EPITAXIAL-FILMS

被引:14
作者
POND, RC
机构
关键词
D O I
10.1016/0022-0248(86)90577-4
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:946 / 950
页数:5
相关论文
共 9 条
[1]   SYMMETRY APPROACH TO DOMAIN-STRUCTURES [J].
JANOVEC, V .
FERROELECTRICS, 1976, 12 (1-4) :43-53
[2]   LONG-RANGE ORDER IN ALXGA1-XAS [J].
KUAN, TS ;
KUECH, TF ;
WANG, WI ;
WILKIE, EL .
PHYSICAL REVIEW LETTERS, 1985, 54 (03) :201-204
[3]  
MICKELSEN JC, 1983, PHYS REV B, V28, P7130
[4]  
NAKAYAMA H, 1986, I PHYS C SER, V79
[5]   OBSERVATION OF ORDER-DISORDER TRANSITIONS IN STRAINED-SEMICONDUCTOR SYSTEMS [J].
OURMAZD, A ;
BEAN, JC .
PHYSICAL REVIEW LETTERS, 1985, 55 (07) :765-768
[6]  
POND RC, 1985, DISLOCATIONS PROPERT, P72
[7]  
POND RC, 1985, SURFACE SCI, V151, P1191
[8]  
POND RC, 1985, DEC MAT RES SOC S P
[9]  
Shubnikov AV., 1974, SYMMETRY SCI ART, DOI [10.1007/978-1-4684-2067-8_12, DOI 10.1007/978-1-4684-2067-8_12]