Attractive forces between micron-sized particles: A patch charge model

被引：18

作者：

Pollock, HM

Burnham, NA

Colton, RJ

机构：

[1] ECOLE POLYTECH FED LAUSANNE, INST GENIE ATOM, DEPT PHYS, CH-1015 LAUSANNE, SWITZERLAND

[2] USN, RES LAB, SURFACE CHEM BRANCH, WASHINGTON, DC 20375 USA

来源：

JOURNAL OF ADHESION | 1995年 / 51卷 / 1-4期

关键词：

powder; interparticle force; force curve; dipole-dipole interaction; patch field; patch charge; atomic force microscope; AFM;

D O I：

10.1080/00218469508009990

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

To clarify the role of interparticle attraction in engineering situations that involve the handling of powders, three promising new approaches have recently been described. In this review we outline (i) the use of proximal-probe technology to measure forces acting on an individual particle directly, (ii) the modelling of types of force that depend on interactions between dipole layers or ''patch charges'' arising from inhomogeneities in work function, (iii) the role of deformation associated with adhesive forces.

引用

页码：71 / 86

页数：16

共 37 条

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