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IMPROVED HIGH-RESOLUTION IMAGE-PROCESSING OF BRIGHT FIELD ELECTRON-MICROGRAPHS .1. THEORY

被引：175
作者：
KIRKLAND, EJ
机构：
来源：
ULTRAMICROSCOPY | 1984年 / 15卷 / 03期
关键词：
D O I：
10.1016/0304-3991(84)90037-8
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
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页码：151 / 172
页数：22
相关论文
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