ACTIVATION-ENERGIES ASSOCIATED WITH CURRENT NOISE OF THIN METAL-FILMS

被引：13

作者：

COTTLE, JG

CHEN, TM

机构：

来源：

关键词：

D O I：

10.1007/BF02652134

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：467 / 471

页数：5

共 17 条

BLACK, JR .

[2] ELECTROMIGRATION IN THIN GOLD-FILMS ON MOLYBDENUM SURFACES [J].

BLECH, IA ;

KINSBRON, E .

[3]

Chen T. M., 1985, 23rd Annual Proceedings Reliability Physics 1985 (Cat. No. 85CH2113-9), P87, DOI 10.1109/IRPS.1985.362081

[4]

CHEN TM, 1987, 9TH P INT C NOIS PHY

[5]

COTTLE JG, 1988, 26TH P INT REL PHYS

[6]

COTTLE JG, 1987, THESIS U S FLORIDA, P71

[7]

DHEURLE FM, 1975, THIN FILMS INTERDIFF, P266

[8] LOW-FREQUENCY FLUCTUATIONS IN SOLIDS - 1-F NOISE [J].

DUTTA, P ;

HORN, PM .

[9]

Hong C. C., 1985, 23rd Annual Proceedings Reliability Physics 1985 (Cat. No. 85CH2113-9), P108, DOI 10.1109/IRPS.1985.362084

KOCH, RH ;

LLOYD, JR ;

CRONIN, J .