THERMALLY STIMULATED CURRENT MEASUREMENT OF TRAPS IN DETECTOR-GRADE CDTE

被引：6

作者：

BARNES, CE

ZANIO, K

机构：

[1] SANDIA LABS, ALBUQUERQUE, NM 87115 USA

[2] HUGHES RES LABS, MALIBU, CA 90265 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1976年 / 23卷 / 01期

关键词：

D O I：

10.1109/TNS.1976.4328233

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：177 / 181

页数：5

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