DETECTION EFFICIENCY IN ATOM-PROBE TIME-OF-FLIGHT MASS-SPECTROMETRY

[1] ANDREN HO, 1979, SCAND J METALL, V8, P147

[2] PERFORMANCE OF A MICROCHANNEL PLATE ION DETECTOR IN THE ENERGY-RANGE 3-25 KEV [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1985, 18 (11): : 920 - 925

[3] THE DETERMINATION OF GRAIN-BOUNDARY SEGREGATION PROFILES IN BORON CONTAINING AUSTENITIC STAINLESS-STEELS USING TEM, AP AND IAP [J]. JOURNAL DE PHYSIQUE, 1984, 45 (NC9): : 391 - 396

[4] AIMING PERFORMANCE OF ATOM PROBE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1975, 46 (09) : 1237 - 1240

[5] LOBERG B, 1969, ARK FYS, V39, P383

[6] THE SIMULATION OF FIM DESORPTION PATTERNS [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (03): : 803 - 814

[7] Muller E W, 1969, FIELD ION MICROSCOPY

[8] FIELD IONIZATION OF GASES AT A METAL SURFACE AND THE RESOLUTION OF THE FIELD ION MICROSCOPE [J]. PHYSICAL REVIEW, 1956, 102 (03): : 624 - 631

[9] NISHIKAWA O, 1981, REV SCI INSTRUM, V52, P25

[10] FIELD CALIBRATION USING ENERGY-DISTRIBUTION OF FIELD IONIZATION [J]. PHYSICAL REVIEW LETTERS, 1973, 30 (12) : 532 - 535

[1] ANDREN HO, 1979, SCAND J METALL, V8, P147

[2] PERFORMANCE OF A MICROCHANNEL PLATE ION DETECTOR IN THE ENERGY-RANGE 3-25 KEV [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1985, 18 (11): : 920 - 925

[3] THE DETERMINATION OF GRAIN-BOUNDARY SEGREGATION PROFILES IN BORON CONTAINING AUSTENITIC STAINLESS-STEELS USING TEM, AP AND IAP [J]. JOURNAL DE PHYSIQUE, 1984, 45 (NC9): : 391 - 396

[4] AIMING PERFORMANCE OF ATOM PROBE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1975, 46 (09) : 1237 - 1240

[5] LOBERG B, 1969, ARK FYS, V39, P383

[6] THE SIMULATION OF FIM DESORPTION PATTERNS [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (03): : 803 - 814

[7] Muller E W, 1969, FIELD ION MICROSCOPY

[8] FIELD IONIZATION OF GASES AT A METAL SURFACE AND THE RESOLUTION OF THE FIELD ION MICROSCOPE [J]. PHYSICAL REVIEW, 1956, 102 (03): : 624 - 631

[9] NISHIKAWA O, 1981, REV SCI INSTRUM, V52, P25

[10] FIELD CALIBRATION USING ENERGY-DISTRIBUTION OF FIELD IONIZATION [J]. PHYSICAL REVIEW LETTERS, 1973, 30 (12) : 532 - 535