CHARACTERIZATION OF NB-8 WT-PERCENT-AL WIRES BY ANALYTICAL ELECTRON-MICROSCOPY

被引：8

作者：

KING, WE

THIEME, CLH

FONER, S

机构：

[1] MIT,FRANCIS BITTER NATL MAGNET LAB,CAMBRIDGE,MA 02139

[2] MIT,CTR PLASMA,CAMBRIDGE,MA 02139

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1985年 / 21卷 / 02期

关键词：

D O I：

10.1109/TMAG.1985.1063789

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：815 / 818

页数：4

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