GENERATION OF ULTRASHORT X-RAY PULSES

[1] TIME-RESOLVED X-RAY TRANSMISSION GRATING SPECTROMETER FOR STUDYING LASER-PRODUCED PLASMAS [J]. APPLIED OPTICS, 1983, 22 (02): : 318 - 327

[2] X-RAYS FROM FOIL-EXCITED IODINE BEAMS [J]. PHYSICAL REVIEW A, 1975, 12 (06): : 2413 - 2419

[3] REFLECTION EXTENDED X-RAY ABSORPTION FINE-STRUCTURE RECORDED USING A LASER-PRODUCED PLASMA X-RAY SOURCE [J]. APPLIED PHYSICS LETTERS, 1985, 47 (05) : 442 - 444

[4] EISENTHAL KB, 1982, PICOSECOND PHENOMENA, V3

[5] Ginzburg V. L., 1970, PROPAGATION ELECTROM, P260

[6] GRYZINSKI M, 1965, PHYS REV A, V138, P336

[7] KUHLKE D, 1987, APPL PHYS LETT, V50, P1785, DOI 10.1063/1.97696

[8] X-RAY CHARACTERIZATION OF PICOSECOND LASER PLASMAS [J]. OPTICS COMMUNICATIONS, 1987, 63 (04) : 253 - 258

[9] SYNCHROTRON X-RAY-DIFFRACTION STUDY OF SILICON DURING PULSED-LASER ANNEALING [J]. PHYSICAL REVIEW LETTERS, 1982, 48 (05) : 337 - 340

[10] MALLOZZI PJ, 1979, SCIENCE, V206, P355

[1] TIME-RESOLVED X-RAY TRANSMISSION GRATING SPECTROMETER FOR STUDYING LASER-PRODUCED PLASMAS [J]. APPLIED OPTICS, 1983, 22 (02): : 318 - 327

[2] X-RAYS FROM FOIL-EXCITED IODINE BEAMS [J]. PHYSICAL REVIEW A, 1975, 12 (06): : 2413 - 2419

[3] REFLECTION EXTENDED X-RAY ABSORPTION FINE-STRUCTURE RECORDED USING A LASER-PRODUCED PLASMA X-RAY SOURCE [J]. APPLIED PHYSICS LETTERS, 1985, 47 (05) : 442 - 444

[4] EISENTHAL KB, 1982, PICOSECOND PHENOMENA, V3

[5] Ginzburg V. L., 1970, PROPAGATION ELECTROM, P260

[6] GRYZINSKI M, 1965, PHYS REV A, V138, P336

[7] KUHLKE D, 1987, APPL PHYS LETT, V50, P1785, DOI 10.1063/1.97696

[8] X-RAY CHARACTERIZATION OF PICOSECOND LASER PLASMAS [J]. OPTICS COMMUNICATIONS, 1987, 63 (04) : 253 - 258

[9] SYNCHROTRON X-RAY-DIFFRACTION STUDY OF SILICON DURING PULSED-LASER ANNEALING [J]. PHYSICAL REVIEW LETTERS, 1982, 48 (05) : 337 - 340

[10] MALLOZZI PJ, 1979, SCIENCE, V206, P355