DETERMINATION OF STRONG-INTERACTION WIDTHS AND SHIFTS OF PIONIC X-RAYS WITH A CRYSTAL SPECTROMETER

被引：5

作者：

BOEHM, F ^{[1
]}

HAHN, A ^{[1
]}

HENRIKSON, HE ^{[1
]}

MILLER, J ^{[1
]}

POWERS, RJ ^{[1
]}

VOGEL, P ^{[1
]}

VUILLEUMIER, JL ^{[1
]}

WANG, KC ^{[1
]}

机构：

[1] CALTECH,PASADENA,CA 91125

来源：

PHYSICAL REVIEW LETTERS | 1977年 / 38卷 / 05期

关键词：

D O I：

10.1103/PhysRevLett.38.215

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：215 / 218

页数：4

共 8 条

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FREND, HU ;

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[2] X-RAY WAVELENGTHS [J].

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[3]

Cohen E. R., 1973, Journal of Physical and Chemical Reference Data, V2, P663, DOI 10.1063/1.3253130

[4] 2 METER CURVED-CRYSTAL SPECTROMETER WITH IMPROVED EFFICIENCY FOR USE AT LAMPF [J].

HENRIKSON, HE ;

BOEHM, F .

NUCLEAR INSTRUMENTS & METHODS, 1974, 121 (02) :269-273

[5]

MARUSHENKO VN, 1976, JETP LETT+, V23, P72

[6] PRECISION ENERGY MEASUREMENT OF I125 GAMMA LINE [J].

MILLER, JP ;

BOEHM, F ;

HENRIKSON, HE .

NUCLEAR INSTRUMENTS & METHODS, 1976, 136 (02) :403-403

[7]

POWERS RJ, 1976, MESON NUCLEAR PHYSIC, P552

[8]

Scofield J. H., 1974, Atomic Data and Nuclear Data Tables, V14, P121, DOI 10.1016/S0092-640X(74)80019-7

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