ION-BEAM CRYSTALLOGRAPHY OF SILICON SURFACES .2. SI(100)-(2X1)

被引：144

作者：

TROMP, RM ^{[1
]}

SMEENK, RG ^{[1
]}

SARIS, FW ^{[1
]}

CHADI, DJ ^{[1
]}

机构：

[1] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304

来源：

SURFACE SCIENCE | 1983年 / 133卷 / 01期

关键词：

D O I：

10.1016/0039-6028(83)90488-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：137 / 158

页数：22

共 46 条

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[2]

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BECKER, GE .

PHYSICAL REVIEW B, 1980, 21 (04) :1497-1510

[9] REEXAMINATION OF THE SI(100) SURFACE RECONSTRUCTION [J].

CHADI, DJ .

APPLIED OPTICS, 1980, 19 (23) :3971-3973

[10] SI(100) SURFACES - ATOMIC AND ELECTRONIC-STRUCTURES [J].

CHADI, DJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (05) :1290-1296

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