X-RAY-PHOTOELECTRON-SPECTROSCOPY DETERMINATION OF VALENCE BAND-STRUCTURE OF POLYMERIC SULFUR NITRIDE, (SN)X

被引：45

作者：

MENGEL, P

GRANT, PM

RUDGE, WE

SCHECHTMAN, BH

RICE, DW

机构：

[1] IBM CORP,RES LAB,SAN JOSE,CA 95193

[2] IBM CORP,GEN PROD DIV,SAN JOSE,CA 95193

来源：

PHYSICAL REVIEW LETTERS | 1975年 / 35卷 / 26期

关键词：

D O I：

10.1103/PhysRevLett.35.1803

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：1803 / 1806

页数：4

相关论文

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[8] VALENCE ELECTRONIC STRUCTURE AND CHARGE-TRANSFER IN TETRATHIOFULVALINIUM TETRACYANOQUINODIMETHANE (TTF-TCNQ) FROM PHOTOEMISSION SPECTROSCOPY
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[9] ELECTRONIC-STRUCTURE OF POLYMERIC SULFUR NITRIDE, (SN)X, FROM X-RAY-PHOTOELECTRON SPECTROSCOPY
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[10] MENGEL P, TO BE PUBLISHED