ION-BEAM MIXING OF SILVER MAGNESIUM-OXIDE MULTILAYERS

被引：8

作者：

FUCHS, G

TREILLEUX, M

THEVENARD, P

机构：

[1] Univ Claude Bernard, Lyon I, France

来源：

THIN SOLID FILMS | 1988年 / 165卷 / 01期

关键词：

Ion Beams - Microscopic Examination--Transmission Electron Microscopy - Silver and Alloys--Thin Films - X-rays--Diffraction;

D O I：

10.1016/0040-6090(88)90705-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The aim of the present work is to report on Ag-MgO epitaxial thin films irradiated with energetic xenon ions. For this purpose, optical absorption measurements, Rutherford backscattering spectometry of alpha particles and TEM observations have been performed on such metal-oxide interfaces. The interfaces between silver and magnesium oxide were obtained by two different means: (i) evaporation of silver and magnesium oxide multilayers on air-cleaved single crystals of alkali halide (NaCl, KBr); (ii) evaporation of silver films on air-cleaved single crystals of magnesium oxide oriented in the (100) direction.

引用

页码：347 / 358

页数：12

共 32 条

[1] AGGREGATION OF ION-IMPLANTED SILVER IN MAGNESIUM-OXIDE SINGLE-CRYSTALS [J].