STRUCTURE OF GRAIN-BOUNDARIES IN SEMICONDUCTORS

[1] PARTIAL SECONDARY DISLOCATIONS IN GERMANIUM GRAIN-BOUNDARIES .1. PERIODIC NETWORK IN A SIGMA=5 COINCIDENCE BOUNDARY [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (01): : 189 - 200

[2] Bollmann W., 1970, CRYSTAL DEFECTS CRYS

[3] LOW-ANGLE [011] TILT BOUNDARY IN GERMANIUM .1. HIGH-RESOLUTION STRUCTURE DETERMINATION [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1979, 39 (04): : 405 - 418

[4] BOURRET A, UNPUB ULTRAMICROSCOP

[5] THE ATOMIC-STRUCTURE OF A LARGE-ANGLE [001] TWIST BOUNDARY IN GOLD DETERMINED BY A JOINT COMPUTER MODELING AND X-RAY-DIFFRACTION STUDY [J]. ACTA METALLURGICA, 1980, 28 (05): : 575 - 588

[6] Carter C. B., 1982, Grain Boundaries in Semiconductors. Proceedings of the Materials Research Society Annual Meeting, P33

[7] ELECTRON-DIFFRACTION AND MICROSCOPY STUDIES OF THE STRUCTURE OF GRAIN-BOUNDARIES IN SILICON [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (02): : 441 - 467

[8] Cunningham B., 1982, Grain Boundaries in Semiconductors. Proceedings of the Materials Research Society Annual Meeting, P21

[9] DANTERROCHES C, 1982, THESIS GRENOBLE

[10] DANTERROCHES C, 1980, ELECTRON MICROS, V1, P316

[1] PARTIAL SECONDARY DISLOCATIONS IN GERMANIUM GRAIN-BOUNDARIES .1. PERIODIC NETWORK IN A SIGMA=5 COINCIDENCE BOUNDARY [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (01): : 189 - 200

[2] Bollmann W., 1970, CRYSTAL DEFECTS CRYS

[3] LOW-ANGLE [011] TILT BOUNDARY IN GERMANIUM .1. HIGH-RESOLUTION STRUCTURE DETERMINATION [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1979, 39 (04): : 405 - 418

[4] BOURRET A, UNPUB ULTRAMICROSCOP

[5] THE ATOMIC-STRUCTURE OF A LARGE-ANGLE [001] TWIST BOUNDARY IN GOLD DETERMINED BY A JOINT COMPUTER MODELING AND X-RAY-DIFFRACTION STUDY [J]. ACTA METALLURGICA, 1980, 28 (05): : 575 - 588

[6] Carter C. B., 1982, Grain Boundaries in Semiconductors. Proceedings of the Materials Research Society Annual Meeting, P33

[7] ELECTRON-DIFFRACTION AND MICROSCOPY STUDIES OF THE STRUCTURE OF GRAIN-BOUNDARIES IN SILICON [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (02): : 441 - 467

[8] Cunningham B., 1982, Grain Boundaries in Semiconductors. Proceedings of the Materials Research Society Annual Meeting, P21

[9] DANTERROCHES C, 1982, THESIS GRENOBLE

[10] DANTERROCHES C, 1980, ELECTRON MICROS, V1, P316