NATURE AND HABIT PLANES OF DEFECTS IN P+ ION-IMPLANTED SILICON

[1] USEFUL PROPERTIES OF DARK-FIELD ELECTRON IMAGES [J]. PHYSICA STATUS SOLIDI, 1965, 12 (02): : 843 - &

[2] BICKNELL RW, PRIVATE COMMUNICATIO

[3] BICKNELL RW, 1971, THESIS U LONDON

[4] INVESTIGATIONS OF DISLOCATION STRAIN FIELDS USING WEAK BEAMS [J]. PHILOSOPHICAL MAGAZINE, 1969, 20 (168): : 1265 - &

[5] Davidson S. M., 1970, Radiation Effects, V6, P33, DOI 10.1080/00337577008235043

[6] HIRSCH P, 1965, ELECT MICROSCOPY THI, P261

[7] HIRSCH PB, 1965, ELECTRON MICROS, P265

[8] DETERMINATION OF GEOMETRY AND NATURE OF SMALL FRANK LOOPS USING WEAK-BEAM METHOD [J]. JOURNAL OF MICROSCOPY-OXFORD, 1973, 98 (JUL): : 155 - 164

[9] SESHAN K, 1974, 32ND P ANN EMSA M ST, P354

[10] TAMURA M, 1971, J JPN SOC APPL PHY S, V40, P9

[1] USEFUL PROPERTIES OF DARK-FIELD ELECTRON IMAGES [J]. PHYSICA STATUS SOLIDI, 1965, 12 (02): : 843 - &

[2] BICKNELL RW, PRIVATE COMMUNICATIO

[3] BICKNELL RW, 1971, THESIS U LONDON

[4] INVESTIGATIONS OF DISLOCATION STRAIN FIELDS USING WEAK BEAMS [J]. PHILOSOPHICAL MAGAZINE, 1969, 20 (168): : 1265 - &

[5] Davidson S. M., 1970, Radiation Effects, V6, P33, DOI 10.1080/00337577008235043

[6] HIRSCH P, 1965, ELECT MICROSCOPY THI, P261

[7] HIRSCH PB, 1965, ELECTRON MICROS, P265

[8] DETERMINATION OF GEOMETRY AND NATURE OF SMALL FRANK LOOPS USING WEAK-BEAM METHOD [J]. JOURNAL OF MICROSCOPY-OXFORD, 1973, 98 (JUL): : 155 - 164

[9] SESHAN K, 1974, 32ND P ANN EMSA M ST, P354

[10] TAMURA M, 1971, J JPN SOC APPL PHY S, V40, P9