IMPULSE ELECTRICAL BREAKDOWN FIELDS OF SHORT VACUUM GAPS

被引:15
作者
TSURUTA, K
机构
来源
IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1987年 / 22卷 / 01期
关键词
D O I
10.1109/TEI.1987.298968
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
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页码:77 / 79
页数:3
相关论文
共 9 条
[1]   INITIATION OF ELECTRICAL BREAKDOWN IN ULTRAHIGH VACUUM [J].
ALPERT, D ;
LEE, DA ;
TOMASCHKE, H ;
LYMAN, EM .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1964, 1 (02) :35-&
[2]   ELECTRICAL BREAKDOWN BETWEEN METAL ELECTRODES IN HIGH VACUUM .I. THEORY [J].
CHARBONNIER, FM ;
BENNETTE, CJ ;
SWANSON, LW .
JOURNAL OF APPLIED PHYSICS, 1967, 38 (02) :627-+
[3]   VACUUM ELECTRICAL BREAKDOWN BETWWEN PLANE-PARALLEL COPPER ELECTRODES [J].
DAVIES, DK ;
BIONDI, MA .
JOURNAL OF APPLIED PHYSICS, 1966, 37 (08) :2969-&
[4]   INITIATION OF ELECTRICAL BREAKDOWN IN VACUUM - REVIEW [J].
DAVIES, DK .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (01) :115-121
[5]   A METHOD FOR OBTAINING AND ANALYZING SENSITIVITY DATA [J].
DIXON, WJ ;
MOOD, AM .
JOURNAL OF THE AMERICAN STATISTICAL ASSOCIATION, 1948, 43 (241) :109-126
[6]  
HACKAM R, 1975, IEEE T ELECTR INSUL, VEI10, P9, DOI 10.1109/TEI.1975.297850
[7]   TEST OF CRITICAL THEORY OF ELECTRICAL BREAKDOWN IN VACUUM [J].
KRANJEC, P ;
RUBY, L .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1967, 4 (02) :94-&
[8]   PRE-BREAKDOWN FIELD-EMISSION CURRENT AND BREAKDOWN MECHANISM OF A SMALL VACUUM GAP [J].
TSURUTA, K .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1983, 18 (03) :204-208
[9]   CATHODE- AND ANODE-INDUCED ELECTRICAL BREAKDOWN IN VACUUM [J].
UTSUMI, T .
JOURNAL OF APPLIED PHYSICS, 1967, 38 (07) :2989-&