EPITAXIAL-GROWTH OF BI12GEO20 THIN-FILM OPTICAL WAVE-GUIDES USING EXCIMER LASER ABLATION

被引：35

作者：

YOUDEN, KE

EASON, RW

GOWER, MC

VAINOS, NA

机构：

[1] UNIV SOUTHAMPTON,OPTOELECTR RES CTR,SOUTHAMPTON SO9 5NH,HANTS,ENGLAND

[2] RUTHERFORD APPLETON LAB,CENT LASER FACIL,DIDCOT OX11 0QX,OXON,ENGLAND

[3] FDN RES & TECHNOL HELLAS,INST ELECTR STRUCT & LASER,GR-71110 HERAKLION,GREECE

来源：

APPLIED PHYSICS LETTERS | 1991年 / 59卷 / 16期

关键词：

D O I：

10.1063/1.106162

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Thin-film optical waveguides of the photorefractive optical material bismuth germanium oxide (Bi12GeO20) have been epitaxially grown onto heated zirconia substrates by excimer laser ablative sputtering. The epitaxial nature and stoichiometry of the films were verified using x-ray diffraction analysis. Waveguide modes were observed for effective refractive indices in close agreement with theoretical predictions.

引用

页码：1929 / 1931

页数：3

共 14 条

[1]

A COMPARISON OF PRISM COUPLING AND SCATTERED-LIGHT WAVE-GUIDE ATTENUATION MEASUREMENTS [J].