EXPERIMENTS ON INTRINSIC AND THERMALLY INDUCED CHAOS IN AN RF-DRIVEN JOSEPHSON JUNCTION

被引：10

作者：

DAVIDSON, A

DUEHOLM, B

BEASLEY, MR

机构：

[1] TECH UNIV DENMARK,PHYS LAB 1,DK-2800 LYNGBY,DENMARK

[2] STANFORD UNIV,DEPT APPL PHYS,STANFORD,CA 94305

来源：

PHYSICAL REVIEW B | 1986年 / 33卷 / 07期

关键词：

D O I：

10.1103/PhysRevB.33.5127

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：5127 / 5130

页数：4

共 19 条

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