THEORY OF SINGLE EVENT LATCHUP IN COMPLEMENTARY METAL-OXIDE SEMICONDUCTOR INTEGRATED-CIRCUITS

被引:45
作者
SHOGA, M
BINDER, D
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关键词
D O I
10.1109/TNS.1986.4334671
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:1714 / 1717
页数:4
相关论文
共 11 条
[1]  
ESTREICH DB, 1982, IEEE T COMPUTER AIDE, V1
[2]   LATCH-UP IN CMOS INTEGRATED-CIRCUITS [J].
GREGORY, BL ;
SHAFER, BD .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1973, NS20 (06) :293-299
[3]  
Grove A. S., 1967, PHYS TECHNOL S, P180
[4]  
GRUBIN HL, 1984, IEEE T NUCLEAR SCI, V31
[5]  
KINOSHITO, 1965, IEEE T NUCLEAR SCI, V12, P83
[6]  
KOLASINSKI WA, 1986, 23RD IEEE ANN C NUCL
[7]  
KOLASINSKI WA, 1979, IEEE T NUCLEAR SCI, V26
[8]  
LEAVY, 1969, IEEE T NUCLEAR SCI, V16, P96
[9]  
MCLEAN FB, 1982, IEEE T NUCLEAR SCI, V29
[10]  
SOLIMAN K, 1983, IEEE T NUCLEAR SCI, V30