SUGGESTED SINGLE EVENT UPSET FIGURE OF MERIT

被引：88

作者：

PETERSEN, EL

LANGWORTHY, JB

DIEHL, SE

机构：

[1] USN, RES LAB, WASHINGTON, DC 20375 USA

[2] N CAROLINA STATE UNIV, RALEIGH, NC 27607 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1983年 / 30卷 / 06期

关键词：

D O I：

10.1109/TNS.1983.4333166

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：4533 / 4539

页数：7

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