MODIFICATION OF ELECTRON-MICROSCOPE FOR SPECIAL CRYSTALLOGRAPHIC APPLICATIONS

被引：7

作者：

DOWELL, WCT ^{[1
]}

WILLIAMS, D ^{[1
]}

机构：

[1] CSIRO,DIV CHEM PHYS,CLAYTON 3168,VICTORIA,AUSTRALIA

来源：

关键词：

D O I：

10.1016/S0304-3991(76)90314-4

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：43 / 48

页数：6

共 16 条

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[2] BURSILL LA, TO BE PUBLISHED
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[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1967, 38 (08) : 1097 - &
[4] IMAGE FORMATION AND CONTRAST FROM CONVERGENT ELECTRON-BEAM
DOWELL, WCT
GOODMAN, P
[J]. PHILOSOPHICAL MAGAZINE, 1973, 28 (02): : 471 - 473
[5] MAGNIFICATION IN ELECTRON-SHADOW MICROSCOPY
DOWELL, WCT
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (06): : 510 - 510
[6] SELECTED-AREA DIFFRACTION IN SHADOW ELECTRON-MICROSCOPE
DOWELL, WCT
[J]. ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1976, 31 (11): : 1435 - &
[7] DOWELL WCT, 1976, OPTIK, V45, P93
[8] DOWELL WCT, IN PRESS
[9] DOWELL WCT, 1974, INT CRYSTALLOGRAPHY, P308
[10] DOWELL WCT, 1974, INT CRYSTALLOGRAPHY, P286