SECONDARY EXCITATION OF IONS IN A MULTI-PHOTON MASS-SPECTROMETER

被引:76
作者
BOESL, U
NEUSSER, HJ
SCHLAG, EW
机构
关键词
D O I
10.1016/0009-2614(82)83540-9
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
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页码:1 / 6
页数:6
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共 14 条
[1]   ISOTOPE SELECTIVE SOFT MULTI-PHOTON IONIZATION AND FRAGMENTATION OF POLYATOMIC-MOLECULES [J].
BOESL, U ;
NEUSSER, HJ ;
SCHLAG, EW .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1981, 103 (17) :5058-5060
[2]   2-PHOTON IONIZATION OF POLYATOMIC-MOLECULES IN A MASS-SPECTROMETER [J].
BOESL, U ;
NEUSSER, HJ ;
SCHLAG, EW .
ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1978, 33 (12) :1546-1548
[3]   MULTI-PHOTON IONIZATION IN THE MASS-SPECTROMETRY OF POLYATOMIC-MOLECULES - CROSS-SECTIONS [J].
BOESL, U ;
NEUSSER, HJ ;
SCHLAG, EW .
CHEMICAL PHYSICS, 1981, 55 (02) :193-204
[4]   VISIBLE AND UV MULTI-PHOTON IONIZATION AND FRAGMENTATION OF POLYATOMIC-MOLECULES [J].
BOESL, U ;
NEUSSER, HJ ;
SCHLAG, EW .
JOURNAL OF CHEMICAL PHYSICS, 1980, 72 (08) :4327-4333
[5]  
BOESL U, 1979, LASER INDUCED PROCES, V6, P219
[6]   LASER WAVELENGTH DEPENDENCE OF THE REMPI MASS-SPECTRUM OF 2,4-HEXADIYNE - DIRECT EVIDENCE FOR DISSOCIATION THROUGH IONIC STATES [J].
CARNEY, T ;
BAER, T .
JOURNAL OF CHEMICAL PHYSICS, 1981, 75 (01) :477-478
[7]   A MODEL FOR MULTI-PHOTON IONIZATION MASS-SPECTROSCOPY WITH APPLICATION TO BENZENE [J].
DIETZ, W ;
NEUSSER, HJ ;
BOESL, U ;
SCHLAG, EW ;
LIN, SH .
CHEMICAL PHYSICS, 1982, 66 (1-2) :105-127
[8]   ISOTOPICALLY SELECTIVE 2-PHOTON IONIZATION OF ANILINE IN SUPERSONIC BEAMS [J].
LEUTWYLER, S ;
EVEN, U .
CHEMICAL PHYSICS LETTERS, 1981, 81 (03) :578-581
[9]   LASER MULTI-PHOTON IONIZATION IN A TIME-OF-FLIGHT MASS-SPECTROMETER - VIBRONIC-MASS SPECTRA OF TRIETHYLENEDIAMINE FROM 425 TO 560 NM [J].
LICHTIN, DA ;
DATTAGHOSH, S ;
NEWTON, KR ;
BERNSTEIN, RB .
CHEMICAL PHYSICS LETTERS, 1980, 75 (02) :214-219
[10]   PHOTOELECTRON ENERGY-DISTRIBUTION FOLLOWING UV LASER IONIZATION OF GAS-PHASE BENZENE [J].
MEEK, JT ;
JONES, RK ;
REILLY, JP .
JOURNAL OF CHEMICAL PHYSICS, 1980, 73 (07) :3503-3505