PATTERN-RECOGNITION PROCEDURE FOR SCANNING OSCILLATION FILMS

被引：27

作者：

KABSCH, W ^{[1
]}

机构：

[1] MAX PLANCK INST MED RES, D-6900 HEIDELBERG, FED REP GER

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1977年 / 10卷 / OCT1期

关键词：

D O I：

10.1107/S0021889877013892

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：426 / 429

页数：4

共 5 条

[1] OPTIMUM STRATEGY IN MEASURING STRUCTURE FACTORS
ARNDT, UW
[J]. ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL CRYSTALLOGRAPHY AND CRYSTAL CHEMISTRY, 1968, B 24 : 1355 - +
[2] SINGLE-CRYSTAL OSCILLATION CAMERA FOR LARGE UNIT CELLS
ARNDT, UW
CHAMPNES.JN
PHIZACKE.RP
WONACOTT, AJ
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1973, 6 (DEC1): : 457 - 463
[3] INTENSITY DETERMINATION BY PROFILE FITTING APPLIED TO PRECESSION PHOTOGRAPHS
FORD, GC
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1974, 7 (DEC1) : 555 - 564
[4] SOLUTION FOR BEST ROTATION TO RELATE 2 SETS OF VECTORS
KABSCH, W
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1976, 32 (SEP1): : 922 - 923
[5] INDEXING OF SINGLE-CRYSTAL X-RAY ROTATION PHOTOGRAPHS
MILCH, JR
MINOR, TC
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1974, 7 (OCT1) : 502 - 505