SMALL-ANGLE X-RAY-SCATTERING STUDY OF GELLING SILICA ORGANIC POLYMER-SOLUTION - SYSTEMS CONTAINING POLY(SODIUM STYRENE-SULFONATE)

被引：16

作者：

NAKANISHI, K ^{[1
]}

SOGA, N ^{[1
]}

MATSUOKA, H ^{[1
]}

ISE, N ^{[1
]}

机构：

[1] KYOTO UNIV,FAC ENGN,DEPT POLYMER CHEM,KYOTO 60601,JAPAN

来源：

JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1992年 / 75卷 / 04期

关键词：

D O I：

10.1111/j.1151-2916.1992.tb04168.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Phase separations which result in micrometer-range interconnected porous morphologies in a silica sol-gel system have been investigated using tetraethoxysilane and poly(sodium styrenesulfonate) (NaPSS) as starting materials. The dependence of domain size of interconnected structure on several important reaction variables such as solution composition and temperature is reported. Small-angle X-ray scattering measurements were performed to detect the effect of coexisting NaPSS on the polymerization behavior of silica in situ. The amount of NaPSS was found to play a key role in determining the micrometer-range gel morphology by affecting the aggregation process and phase separation behavior of hydrolyzed silica.

引用

页码：971 / 975

页数：5

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