A NOVEL TECHNIQUE FOR MEASURING THE FREQUENCY DEVIATION OF SEMICONDUCTOR-LASERS UNDER DIRECT MODULATION

被引:22
作者
TSUCHIDA, H
TAKO, T
OHTSU, M
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1983年 / 22卷 / 01期
关键词
D O I
10.1143/JJAP.22.L19
中图分类号
O59 [应用物理学];
学科分类号
摘要
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页码:L19 / L21
页数:3
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