ANGULAR RESOLVED X-RAY PHOTOEMISSION-STUDY OF DEFECTS INDUCED BY ION-BOMBARDMENT ON THE TIO2 SURFACE

被引：41

作者：

BARDI, U ^{[1
]}

TAMURA, K ^{[1
]}

OWARI, M ^{[1
]}

NIHEI, Y ^{[1
]}

机构：

[1] UNIV TOKYO,INST IND SCI,MINATO KU,TOKYO 106,JAPAN

来源：

APPLIED SURFACE SCIENCE | 1988年 / 32卷 / 04期

关键词：

D O I：

10.1016/0169-4332(88)90087-6

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：352 / 362

页数：11

共 27 条

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