AN IMPROVED SINGLE-LINE METHOD FOR THE WIDE-ANGLE X-RAY-SCATTERING PROFILE ANALYSIS OF POLYMERS

被引：24

作者：

HOFMANN, D

WALENTA, E

机构：

[1] Acad of Sciences of the German, Democratic Republic, Teltow-Seehof,, East Ger, Acad of Sciences of the German Democratic Republic, Teltow-Seehof, East Ger

来源：

POLYMER | 1987年 / 28卷 / 08期

关键词：

CRYSTALS; -; POLYMERS; Crystalline; X-RAYS; Scattering;

D O I：

10.1016/0032-3861(87)90436-8

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

A modified single-line technique for determining separately the size and lattice distortion parameters of the crystalline regions by wide-angle x-ray scattering (WAXS) of typical polymer materials is proposed. The efficiency of the method is demonstrated by model calculations. Furthermore, the improved sngle-line treatment is applied to experimentally gained WAXS profiles of polyethylene, for which, for comparison, a standard two-line profile analysis was also applied. Two alternative single-line methods presented in the literature for the investigation of metal WAXS profiles are taken into consideration.

引用

页码：1271 / 1276

页数：6

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