MORPHOLOGY OF INSTABILITY OF THE WETTING TIPS OF EUTECTIC SNBI, EUTECTIC SNPB, AND PURE SN ON CU

被引:54
作者
KIM, HK
LIOU, HK
TU, KN
机构
[1] Department of Materials Science and Engineering, University of California-Los Angeles, Los Angeles, California
关键词
D O I
10.1557/JMR.1995.0497
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The Ph-based solder used in microelectronics industry is becoming an environmental issue. To understand the wetting behavior of solders with and without Pb, we have studied the surface morphology and wetting reaction of eutectic SnBi, eutectic SnPb, and pure Sn on Cu through the measurements of wetting angle change and wetting tip stability by SEM and EDX. The wetting angle remains constant after the initial spread, but the eutectic SnPb/Cu continues to react and forms a reaction band in front of the solder edge as well as intermetallic compounds at the interface. For eutectic SnBi/Cu, there is no reaction at the wetting tip, and the wetting angle does not change much; however, the interfacial reaction between eutectic SnBi and Cu forms intermetallic compounds at the solder joint; the wetting tip is not in a static equilibrium. A rough surface and edge was observed on the eutectic SnBi/Cu joint, but the eutectic SnPb/Cu has a smoother surface and edge.
引用
收藏
页码:497 / 504
页数:8
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