ION-BEAM ANALYSIS OF DEFECT TRAPPING

被引：31

作者：

SWANSON, ML

HOWE, LM

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 218卷 / 1-3期

关键词：

D O I：

10.1016/0167-5087(83)91053-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：613 / 624

页数：12

共 65 条

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