ROOM-TEMPERATURE DEEP-STATE EMISSION-SPECTRA, RADIATIVE EFFICIENCY, AND LIFETIME OF SOME GAP - TE,N CRYSTALS

被引：4

作者：

BACHRACH, RZ ^{[1
]}

DAPKUS, PD ^{[1
]}

LORIMOR, OG ^{[1
]}

机构：

[1] BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA

来源：

JOURNAL OF APPLIED PHYSICS | 1974年 / 45卷 / 11期

关键词：

D O I：

10.1063/1.1663165

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：4971 / 4973

页数：3

共 11 条

[1] MEASUREMENT OF EXTRINSIC ROOM-TEMPERATURE MINORITY CARRIER LIFETIME IN GAP [J].

BACHRACH, RZ ;

LORIMOR, OG .

JOURNAL OF APPLIED PHYSICS, 1972, 43 (02) :500-&

[2] PHOTON COUNTING APPARATUS FOR KINETIC AND SPECTRAL MEASUREMENTS [J].

BACHRACH, RZ .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (05) :734-&

[3] MINORITY-CARRIER LIFETIMES AND LUMINESCENCE EFFICIENCIES IN NITROGEN-DOPED GAP [J].

DAPKUS, PD ;

HACKETT, WH ;

LORIMOR, OG ;

KAMMLOTT, GW ;

HASZKO, SE .

APPLIED PHYSICS LETTERS, 1973, 22 (05) :227-229

[4] DEEP HOLE TRAPS IN N-TYPE LIQUID ENCAPSULATED CZOCHRALSKI GAP [J].

DISHMAN, JM ;

DALY, DF ;

KNOX, WP .

JOURNAL OF APPLIED PHYSICS, 1972, 43 (11) :4693-+

[5] THERMALLY STIMULATED CURRENT MEASUREMENTS IN N-TYPE LEC GAP [J].

FABRE, E ;

BHARGAVA, RN ;

ZWICKER, WK .

JOURNAL OF ELECTRONIC MATERIALS, 1974, 3 (02) :409-430

[6] ROLE OF OXYGEN IN (ZN, O) DOPED GAP [J].

GHARGAVA, RN .

PHYSICAL REVIEW B, 1970, 2 (02) :387-&

[7] SCANNING ELECTRON-MICROSCOPE CHARACTERIZATION OF GAP RED-EMITTING DIODES [J].

HACKETT, WH ;

SAUL, RH ;

KAMMLOTT, GW ;

DIXON, RW .

JOURNAL OF APPLIED PHYSICS, 1972, 43 (06) :2857-+

[8]

HENRY CH, PRIVATE COMMUNICATIO

[9]

LORIMOR OG, UNPUBLISHED

[10] QUANTUM-EFFICIENCY STANDARDS FOR ELECTROLUMINESCENT DIODES [J].

RALSTON, JM ;

BACHRACH, RZ .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1973, ED20 (11) :1114-1116

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