STRUCTURE AND ANNEALING BEHAVIOR OF METAL FILMS DEPOSITED ON SUBSTRATES NEAR 80 DEGREES K .2. GOLD FILMS ON GLASS

被引:39
作者
VOOK, RW
WITT, F
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1965年 / 2卷 / 05期
关键词
D O I
10.1116/1.1492435
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:243 / &
相关论文
共 19 条
[1]   DETERMINATION OF TWIN FAULT PROBABILITIES FROM DIFFRACTION PATTERNS OF FCC METALS AND ALLOYS [J].
COHEN, JB ;
WAGNER, CNJ .
JOURNAL OF APPLIED PHYSICS, 1962, 33 (06) :2073-&
[2]   ETUDES DE LA STRUCTURE DE RAIES DE DIFFRACTION DES RAYONS X PAR DES COUCHES MINCES DOR [J].
CROCE, P ;
DEVANT, G ;
GANDAIS, M ;
MARRAUD, A .
ACTA CRYSTALLOGRAPHICA, 1962, 15 (APR) :424-&
[3]   DIFFRACTION BY FACE-CENTERED CUBIC CRYSTALS CONTAINING EXTRINSIC STACKING FAULTS [J].
JOHNSON, CA .
ACTA CRYSTALLOGRAPHICA, 1963, 16 (06) :490-&
[4]  
MAYER H, 1955, PHYSIK DUNNER SCHICH, V2
[5]   X-RAY DIFFRACTION BY FACE-CENTERED CUBIC CRYSTALS WITH DEFORMATION FAULTS [J].
PATERSON, MS .
JOURNAL OF APPLIED PHYSICS, 1952, 23 (08) :805-811
[6]   A CORRECTION FOR THE ALPHA-1,ALPHA-2 DOUBLET IN THE MEASUREMENT OF WIDTHS OF X-RAY DIFFRACTION LINES [J].
RACHINGER, WA .
JOURNAL OF SCIENTIFIC INSTRUMENTS AND OF PHYSICS IN INDUSTRY, 1948, 25 (07) :254-255
[7]  
TAYLOR A, 1961, XRAY METALLOGRAPHY, P663
[8]  
VASSAMILLET LF, 1963, ADVAN XRAY ANAL, V6, P142
[9]  
VENABLES JA, 1964, B AM PHYS SOC, V9, P295
[10]   X-RAY DIFFRACTOMETER ATTACHMENT FOR DIRECT OBSERVATION OF EVAPORATED THIN FILMS [J].
VOOK, RW ;
SCHOENING, FRL .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1963, 34 (07) :792-&