ELECTRON-BOMBARDMENT INDUCED DEFECT STATES IN P-INP

被引：16

作者：

LEVINSON, M

TEMKIN, H

BONNER, WA

机构：

来源：

JOURNAL OF ELECTRONIC MATERIALS | 1983年 / 12卷 / 02期

关键词：

D O I：

10.1007/BF02651141

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：423 / 432

页数：10

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