PROPERTIES OF Y-BA-CU-O THIN-FILMS WITH ORDERED DEFECT STRUCTURE - Y2BA4CU8O20-X

被引：121

作者：

CHAR, K ^{[1
]}

LEE, M ^{[1
]}

BARTON, RW ^{[1
]}

MARSHALL, AF ^{[1
]}

BOZOVIC, I ^{[1
]}

HAMMOND, RH ^{[1
]}

BEASLEY, MR ^{[1
]}

GEBALLE, TH ^{[1
]}

KAPITULNIK, A ^{[1
]}

LADERMAN, SS ^{[1
]}

机构：

[1] HEWLETT PACKARD CO,PALO ALTO,CA 94304

来源：

PHYSICAL REVIEW B | 1988年 / 38卷 / 01期

关键词：

D O I：

10.1103/PhysRevB.38.834

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：834 / 837

页数：4

共 18 条

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[2]

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APPLIED PHYSICS LETTERS, 1987, 51 (21) :1753-1755

[7] ORDERED-DEFECT STRUCTURE IN EPITAXIAL YBA2CU3O7-X THIN-FILMS [J].

MARSHALL, AF ;

BARTON, RW ;

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Naito M., 1987, Journal of Materials Research, V2, P713, DOI 10.1557/JMR.1987.0713

[10] CRITICAL CURRENT DENSITIES AND TRANSPORT IN SUPERCONDUCTING YBA2CU3O7-DELTA FILMS MADE BY ELECTRON-BEAM COEVAPORATION [J].

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