FLUX PINNING BY RADIATION-DAMAGE IN OXYGEN-DOPED NIOBIUM

被引:26
作者
AGRAWAL, DC
KRAMER, EJ
LOOMIS, BA
机构
[1] CORNELL UNIV,DEPT MAT SCI & ENGN,ITHACA,NY 14853
[2] ARGONNE NATL LAB,MAT SCI DIV,ARGONNE,IL 60439
[3] CORNELL UNIV,MAT SCI CTR,ITHACA,NY 14853
来源
PHILOSOPHICAL MAGAZINE | 1976年 / 33卷 / 02期
关键词
D O I
10.1080/00318087608225779
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:343 / 355
页数:13
相关论文
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