HIGH-RESOLUTION ELECTRON-MICROSCOPIC STUDIES OF CHEMICAL-REACTIONS IN THIN-FILMS

被引：10

作者：

EYRING, L ^{[1
]}

DUFNER, C ^{[1
]}

GORAL, JP ^{[1
]}

HOLLADAY, A ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,CTR SOLID STATE SCI,TEMPE,AZ 85287

来源：

ULTRAMICROSCOPY | 1985年 / 18卷 / 1-4期

关键词：

CHEMICAL REACTIONS - IMAGE PROCESSING - METALLOGRAPHY - Diffusion - METALS AND ALLOYS - Thin Films - MICROSCOPES; ELECTRON;

D O I：

10.1016/0304-3991(85)90142-1

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The application of HREM to the study of mechanism of solid state chemical reactions looms as one of greatest importance to chemistry. If the reactions occur over seconds or minutes, it is necessary to utilize techniques currently being develooped for recording high-resolution images in real time either on video tape or digitally in the computer. These dynamically recorded images must then be further processed and analyzed. A brief survey of recent, relevant literature is made as an introduction to studies currently being carried out in our laboratories. We have chosen to study chemical reactions that occur in thin films of one element as another diffuses into it. Specifically, juxtaposed members of diffusion couples consisting of Au-Sn and Au-In have been examined utilizing the sequential application of conventional methods of imaging and analysis. The results include the observation of compounds expected from the phase diagram as well as the formation of previously unreported phases.

引用

页码：253 / 274

页数：22

共 52 条

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