XENON-SENSITIZED RADIOLYSIS OF HYDROGEN-SULFIDE IN PRESENCE OF HBR, N2O, CCL4, AND SF6

被引：12

作者：

FORYS, M ^{[1
]}

机构：

[1] UNIV TEACHERS COLL,CHEM DEPT,08-110 SIEDLCE,POLAND

来源：

RADIATION EFFECTS AND DEFECTS IN SOLIDS | 1975年 / 25卷 / 02期

关键词：

D O I：

10.1080/00337577508234736

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

引用

页码：111 / 117

页数：7

共 32 条

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[2]

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[3]

CHRISTOPHOROU LG, 1971, 3 P TIH C RAD CHEM

[4] MASS-SPECTROMETRIC STUDY OF PHOTOIONIZATION .11. HYDROGEN SULFIDE AND SULFUR DIOXIDE [J].

DIBELER, VH ;

LISTON, SK .

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[5] FORMATION OF HS- AND DS- BY DISSOCIATIVE ATTACHMENT IN H2S, HDS, AND D2S [J].

FIQUETFA.F ;

TRONC, M ;

ZIESEL, JP ;

CHIARI, J ;

AZRIA, R .

JOURNAL OF CHEMICAL PHYSICS, 1972, 56 (06) :2540-&

[6]

FLANNERY MR, 1969, CASE STUDIES ATOMIC, pCH1

[7]

FORYS M, 1970, CHEMIA ANALITYCZNA, V15, P1053

[8]

FORYS M, 1971, RADIOCHEM RADIOANAL, V7, P181

[9]

FORYS M, 1972, RADIOCHEM RADIOANAL, V10, P27

[10]

HASTED JB, 1972, PHYSICS ATOMIC COLLI, P435

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