NON-DESTRUCTIVE DEPTH PROFILING THROUGH QUANTITATIVE-ANALYSIS OF SURFACE ELECTRON-SPECTRA

被引：96

作者：

TOUGAARD, S

HANSEN, HS

机构：

来源：

SURFACE AND INTERFACE ANALYSIS | 1989年 / 14卷 / 11期

关键词：

D O I：

10.1002/sia.740141109

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：730 / 738

页数：9

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